Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Raman Spectroscopy: Overview01:20

Raman Spectroscopy: Overview

606
The underlying principle of Raman spectroscopy is based on the interaction between light and matter, specifically molecules' inelastic scattering of photons. When a monochromatic beam of light, typically from a laser source, interacts with a sample, most scattered light has the same frequency as the incident light. This is known as Rayleigh scattering.
However, a small fraction of the scattered light exhibits a frequency shift due to the exchange of energy between the incident photons and...
606
Raman Spectroscopy Instrumentation: Overview01:26

Raman Spectroscopy Instrumentation: Overview

535
A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...
535

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Metabolomic signatures for diagnosis and clinical severity in Parkinson's disease.

EBioMedicine·2026
Same author

Chalcogenide substitution for the synthesis of dye MSe5: a benzoselenadiazole photosensitizer for high-performance DSSCs.

Chemical science·2026
Same author

<b>A new species of the genus <i>Cnipsomorpha</i> (Phasmatodea: Phasmatidae: Clitumninae) from China</b>.

Zootaxa·2026
Same author

Synergistic assembly, disassembly, and protection of complex forms of bundled F-actin.

The Journal of cell biology·2026
Same author

Integrated genomic and immunophenotypic profiling reveals monoclonal origin, smoking-driven evolution and heterogeneous microenvironment in pulmonary adenosquamous carcinoma.

Frontiers in immunology·2026
Same author

Association Between Mental Health Literacy and Its Dimensions with Adolescent Depression and Anxiety: A Cross-Sectional Study Among 5759 Adolescents in China.

Behavioral sciences (Basel, Switzerland)·2026

Related Experiment Video

Updated: Sep 15, 2025

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems
07:44

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems

Published on: April 28, 2016

15.2K

Quantitatively Predicting Angle-Resolved Polarized Raman Intensity of Anisotropic Layered Materials.

Jia-Liang Xie1,2, Tao Liu1,2, Yu-Chen Leng1

  • 1State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.

Advanced Materials (Deerfield Beach, Fla.)
|July 16, 2025
PubMed
Summary

Angle-resolved polarized Raman (ARPR) spectroscopy of anisotropic layered materials (ALMs) is now predictable. This study introduces intrinsic Raman tensors to accurately forecast ARPR intensity, simplifying the analysis of ALM optical properties.

Keywords:
angle‐resolved polarized Raman intensityanisotropic layered materialcomplex Raman tensorcomplex refractive indexoptical anisotropy

More Related Videos

Layer Microdissection of Tricuspid Valve Leaflets for Biaxial Mechanical Characterization and Microstructural Quantification
07:34

Layer Microdissection of Tricuspid Valve Leaflets for Biaxial Mechanical Characterization and Microstructural Quantification

Published on: February 10, 2022

2.1K
Author Spotlight: Unveiling the Potential of VSFG Microscopy in Studying Mesoscopically Heterogeneous Self-Assembled Structures
08:49

Author Spotlight: Unveiling the Potential of VSFG Microscopy in Studying Mesoscopically Heterogeneous Self-Assembled Structures

Published on: December 1, 2023

1.5K

Related Experiment Videos

Last Updated: Sep 15, 2025

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems
07:44

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems

Published on: April 28, 2016

15.2K
Layer Microdissection of Tricuspid Valve Leaflets for Biaxial Mechanical Characterization and Microstructural Quantification
07:34

Layer Microdissection of Tricuspid Valve Leaflets for Biaxial Mechanical Characterization and Microstructural Quantification

Published on: February 10, 2022

2.1K
Author Spotlight: Unveiling the Potential of VSFG Microscopy in Studying Mesoscopically Heterogeneous Self-Assembled Structures
08:49

Author Spotlight: Unveiling the Potential of VSFG Microscopy in Studying Mesoscopically Heterogeneous Self-Assembled Structures

Published on: December 1, 2023

1.5K

Area of Science:

  • Condensed Matter Physics
  • Materials Science
  • Spectroscopy

Background:

  • Angle-resolved polarized Raman (ARPR) spectroscopy reveals optical anisotropy and electron-phonon couplings in anisotropic layered materials (ALMs).
  • ARPR responses in ALMs are complex, showing puzzling dependencies on flake thickness, excitation wavelength, and dielectric environment.
  • Existing methods struggle to accurately predict ARPR intensity profiles for ALMs.

Purpose of the Study:

  • To develop a predictive framework for ARPR intensity in ALM flakes.
  • To introduce intrinsic Raman tensors (Rint) for accurate ARPR analysis.
  • To account for factors like birefringence, linear dichroism, and multilayer interference in ARPR predictions.

Main Methods:

  • Introduced intrinsic Raman tensors (Rint) and effective Raman tensors (Reff).
  • Utilized experimentally determined complex refractive indexes for in-plane axes.
  • Derived Reff elements to quantitatively predict ARPR intensity.
  • Applied the framework to black phosphorus (BP) and four-layer Td-WTe2 flakes.

Main Results:

  • Successfully predicted ARPR intensity profiles for ALM flakes of varying thickness.
  • Demonstrated the intricate dependence of ARPR intensity on ALM thickness, dielectric substrates, and excitation wavelengths.
  • The developed framework accurately accounts for optical phenomena like birefringence and multilayer interference.

Conclusions:

  • The proposed framework enables accurate prediction of ARPR intensity for ALM flakes.
  • This approach simplifies the understanding and prediction of ARPR responses in ALMs.
  • The framework is extendable to various ALM thicknesses, from thin layers to the bulk limit.