Fast Gaussian fitting peak extraction for confocal microscopy

The axial positioning accuracy in confocal microscopy measurements is determined by the peak extraction algorithm of the intensity response curve. Existing peak extraction algorithms struggle to balance solution precision and computational efficiency, making it difficult to achieve online measurement. This paper proposes a fast Gaussian fitting method that transforms the nonlinear iterative fitting problem into a linear solution problem through Gaussian function linearisation, significantly improving computational efficiency. Experimental validation shows that the difference in solution accuracy between the fast Gaussian method and the traditional fitting method is no more than 3 nm, with a computational efficiency increasing at least 144 times.