Related Experiment Video
Updated: Sep 15, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Widespread misidentification of scanning electron microscope instruments in the peer-reviewed materials science and
Reese A K Richardson1,2, Jeonghyun Moon1,2, Spencer S Hong1,3
1Department of Engineering Sciences and Applied Mathematics, Northwestern University, Evanston, Illinois, United States of America.
Abstract:
Materials science and engineering (MSE) research has, for the most part, escaped the doubts raised about the reliability of the scientific literature by recent large-scale replication studies in psychology and cancer biology. However, users on post-publication peer review sites have recently identified dozens of articles where the make and model of the scanning electron microscope (SEM) listed in the text of the paper does not match the instrument's metadata visible in the images in the published article. In order to systematically investigate this potential risk to the MSE literature, we develop a semi-automated approach to scan published figures for this metadata and check it against the SEM instrument identified in the text. Starting from an exhaustive set of 1,067,108 articles published since 2010 in 50 journals with impact factors ranging from 2 to 24, we identify 11,314 articles for which SEM manufacturer and model can be identified in an image's metadata. For 21.2% of those articles, the image metadata does not match the SEM manufacturer or model listed in the text and, for another 24.7%, at least some of the instruments used in the study are not reported. We find that articles with SEM misidentification are more likely to have existing observations of improprieties made on post-publication peer review site PubPeer than other MSE articles and that a subset of these articles within the subfield of electrochemistry are more likely to incorrectly estimate the optical band gap if the article features SEM misidentification. This suggests that SEM misidentification may be a tractable signature for flagging problematic MSE articles. Unexplained patterns common to many of these articles suggest the involvement of paper mills, organizations that mass-produce, sell authorship on, and publish fraudulent scientific manuscripts at scale.
More Related Videos
10:00Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
Published on: July 5, 2016
12:18Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
Published on: June 27, 2022
Related Concept Videos
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Overview of Electron Microscopy
Overview of Microscopy Techniques
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Transmission Electron Microscopy
Preparation of Samples for Electron Microscopy