A low-background setup for in situ X-ray total scattering combined with fast scanning calorimetry

We demonstrate a setup, combining fast scanning calorimetry with X-ray total scattering at a synchrotron beamline, allowing for in situ characterizations of the nano-scale structure of samples during and after temperature scans. The setup features a portable vacuum chamber providing a high signal-to-background ratio even on amorphous samples, which enables the observation of detailed structural changes between different sample states. We present three use cases, including one that leverages the high cooling rate of 10⁴ K s^-1 achievable by this setup. Our demonstration opens the door to various applications in materials science where understanding the interplay between structure and thermodynamics is crucial.