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Laser-driven proton sources for efficient radiation testing.

Beatrice D'Orsi1,2, Corrado Altomare3, Alessandro Ampollini4

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This summary is machine-generated.

This study shows that laser-driven proton irradiation is a highly efficient method for stress-testing electronic components in high-radiation environments, requiring lower doses and less time than traditional sources.

Keywords:
Gamma radiationLaser-plasma accelerationNeutronsProtonsRadiation hardnessTIDTNSATransistors

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Area of Science:

  • Physics
  • Engineering
  • Materials Science

Background:

  • High-radiation environments in fields like particle physics and space exploration pose risks to electronic components.
  • Damage to these Commercial Off-The-Shelf (COTS) components can compromise facility reliability.

Purpose of the Study:

  • To investigate the effects of various radiation sources on COTS electronic components.
  • To compare the efficiency of different stress-testing methods for radiation environments.

Main Methods:

  • Electronic components were exposed to gamma rays, laser-driven protons, conventionally accelerated protons, and neutrons.
  • Device parameters were analyzed after various irradiation conditions.

Main Results:

  • Radiation exposure caused significant degradation in electrical performance due to induced defects.
  • Variations in radiation effects were observed even at the same dose levels.
  • Laser-driven proton irradiation proved more efficient, achieving equivalent stress-testing at significantly lower doses and faster rates.

Conclusions:

  • Laser-driven proton irradiation offers a more efficient and rapid method for qualifying electronic components for high-radiation environments.
  • Understanding radiation-induced defects is crucial for ensuring the reliability of electronic systems in harsh conditions.