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Updated: Sep 13, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Tianyang Deng1, Charles Larouche1,2, Saqib Ali1
1Département de Chimie, Université Laval, Québec, QC G1V 0A6, Canada.
Microstructured silicon internal reflection elements (μSi-IREs) offer a low-cost, user-friendly alternative for attenuated total reflection Fourier transform infrared (ATR-FTIR) spectroscopy. Larger elements with a 35-degree angle show superior sensitivity and detection limits.
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