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Assessment of Interference in CIEDs Exposed to Magnetic Fields at Power Frequencies: Induced Voltage Analysis and
Mengxi Zhou1, Djilali Kourtiche1, Julien Claudel1
1Institut Jean Lamour, Université de Lorraine-CNRS (UMR 7198), 2 allée André Guinier, Campus Artem, 54000 Nancy, France.
Abstract:
Despite ongoing concerns about electromagnetic interference affecting cardiac implantable electronic devices (CIEDs) in the electrical industry workplaces, no study has experimentally assessed induced voltages in CIEDs under exposure to power-frequency magnetic fields. This study addresses this gap by quantifying such interference using a dedicated experimental setup to reproduce high intensity magnetic fields and to measure voltages induced on CIEDs under exposure. A thorough analysis was carried out in comparison with formula-based and simulation approaches applied in previous studies. The induced voltages on CIEDs were measured across varying configurations, including sensing mode, implantation method, exposure frequency, and magnetic field orientation. Our findings reveal the induced voltage levels under exposure from a statistical perspective and highlight correlations between susceptibility and the impact factors, with unipolar configurations and left pectoral implants exhibiting the highest susceptibility. This work provides insights into electromagnetic interference risks for CIED carriers and supports the development of individual protection strategies to enhance occupational safety.
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