Phase Contrast and Differential Interference Contrast Microscopy
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Volkan Gurses1,2, Samantha I Davis3,4, Raju Valivarthi3,4
1Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA, USA. gurses@caltech.edu.
Researchers developed a chip-based phased array system capable of receiving, imaging, and manipulating non-classical light. This breakthrough enables wireless quantum technologies for enhanced sensing and communication applications.
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