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Related Concept Videos

P-N junction01:11

P-N junction

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A p-n junction is formed when p-type and n-type semiconductor materials are joined together. At the interface of the p-n junction, holes from the p-side and electrons from the n-side begin to diffuse into the opposite sides due to the concentration gradient. This diffusion of carriers leads to a region around the junction where there are no free charge carriers, known as the depletion region. The charge density within the depletion region for the n-side and p-side can be described by the...
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Fabricating van der Waals Heterostructures with Precise Rotational Alignment
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High-Performance p-Type 1D Van der Waals Electronics Prepared Through Solution Processing.

Tianchao Guo1, Xiangming Xu1, Maolin Chen1

  • 1Materials Science and Engineering, Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia.

Advanced Materials (Deerfield Beach, Fla.)
|July 30, 2025
PubMed
Summary
This summary is machine-generated.

High-performance p-type transistors were fabricated using solution-processed tellurium (Te) nanowires (NWs). Van der Waals (vdW) junctions between Te NWs showed minimal impact on device mobility, enabling large-area electronics.

Keywords:
high mobilitylarge areap‐type semiconductorsolution process

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Electronics Engineering

Background:

  • Solution-based methods offer low-cost, large-scale electronics fabrication but struggle with high-performance p-type transistors.
  • Van der Waals (vdW) materials enable atomically defined interfaces crucial for efficient charge transport and enhanced device performance.

Purpose of the Study:

  • To demonstrate high-performance p-type transistors using solution-processed tellurium (Te) nanowires (NWs).
  • To investigate the impact of vdW junctions on carrier mobility in Te NW-based devices.
  • To fabricate large-area vdW films of Te NWs for practical electronic applications.

Main Methods:

  • Fabrication of transistors using individual tellurium (Te) nanowires (NWs).
  • Characterization of device performance, including mobility and current on/off ratio.
  • Preparation and testing of large-area 1D Te NWs vdW films.

Main Results:

  • Individual Te NW transistors achieved high mobilities averaging ≈370 cm²V⁻¹s⁻¹.
  • Te-Te NW junctions exhibited mobilities comparable to individual NWs, indicating negligible degradation due to vdW contacts.
  • Large-area Te NW vdW films yielded transistors with average hole mobility of ≈94.9 cm²V⁻¹s⁻¹, subthreshold swing of ≈248.6 mVdec⁻¹, current on/off ratio of ≈10⁴, and low operating voltage of 1 V.

Conclusions:

  • Solution-processed Te NWs are suitable for high-performance p-type transistors.
  • vdW contacts in Te NW networks do not significantly impede charge transport, enabling scalable device fabrication.
  • This work paves the way for advanced solution-processed electronics utilizing vdW materials.