Electron Microscope Tomography and Single-particle Reconstruction
Transmission Electron Microscopy
Scanning Electron Microscopy
Preparation of Samples for Electron Microscopy
Overview of Electron Microscopy
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Cryo-Electron Tomography Remote Data Collection and Subtomogram Averaging
Published on: July 12, 2022
Louis-Marie Lebas1, Karine Masenelli-Varlot1, Victor Trillaud1
1MATEIS, UMR5510, Univ Lyon, INSA Lyon, UCBL, CNRS, Villeurbanne Cedex, 69621, France.
A new protocol allows nanoscale imaging of beam-sensitive samples under environmental conditions. This method offers precise control, automated data acquisition, and easier sample preparation for materials science and biology applications.
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