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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Improved SPGD algorithm for optical phased array chip phase error correction in Lidar applications.
Applied Optics
|August 12, 2025
Summary
An improved algorithm corrects random phase errors in optical phased array (OPA) chips, enhancing beam quality for Lidar systems. This method offers faster convergence and better accuracy, especially for complex, large-channel designs.
Area of Science:
- Photonics
- Optical Engineering
- Lidar Technology
Background:
- Random phase errors in silicon-photonic optical phased array (OPA) chips degrade output beam quality.
- Efficient phase error correction is crucial for OPA-based Lidar systems.
Purpose of the Study:
- To introduce and evaluate an improved Adaptive Stochastic Parallel Gradient Descent (ASPGD) algorithm for OPA random phase error correction.
- To demonstrate the algorithm's effectiveness, particularly for large channel count OPA designs.
Main Methods:
- Development and implementation of an enhanced ASPGD algorithm.
- Experimental validation using a fabricated 16-channel silicon-photonic OPA chip.
- Comparative analysis against traditional Stochastic Parallel Gradient Descent (SPGD) and genetic algorithms.
Main Results:
- Successful demonstration of ASPGD for OPA phase error calibration on a 16-channel chip.
- ASPGD exhibited significantly faster convergence compared to SPGD and genetic algorithms.
- Higher cosine similarity values for the corrected beam profile were achieved with ASPGD, especially for increased channel counts.
Conclusions:
- The improved ASPGD algorithm provides efficient and accurate phase error correction for OPA chips.
- This algorithm shows superior performance over traditional methods for large channel count OPA designs.
- The work contributes to the practical deployment of OPA technology in chip-scale, long-range Lidar applications.
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