High-resolution microwave frequency measurement based on frequency-to-time mapping via optical delay scanning

Area of Science:

• Photonics and Optical Engineering
• Microwave Engineering
• Measurement Science

Background:

• Accurate microwave frequency measurement is crucial for various applications.
• Existing methods may face limitations in resolution or complexity.
• Optical techniques offer potential for high-precision measurements.

Purpose of the Study:

• To propose and analyze a high-resolution frequency measurement system using optical delay scanning.
• To demonstrate the system's capability for precise microwave frequency identification.
• To evaluate the system's performance under critical operational parameters.

Main Methods:

• Utilizing a scanning optical delay line (ODL) to create a time delay difference in parallel optical paths.
• Employing a balanced photodiode to monitor the AC power curve.
• Correlating the AC power curve with the ODL scanning map to determine frequency.

Main Results:

• Simulated frequency measurement capability from 5-25 GHz.
• Achieved an accuracy of ±13 MHz.
• Analyzed system performance concerning modulation coefficient, MZM bias drift, and extinction ratio.

Conclusions:

• The proposed optical delay scanning technique enables high-resolution microwave frequency measurement.
• The system demonstrates a viable approach for accurate frequency determination within the 5-25 GHz range.
• Further analysis confirms the impact of critical parameters on system performance.