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Updated: Sep 11, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Extraction of phase information for moiré fringes based on adaptive wavelet basis frequency
Abstract:
As a critical step in moiré tomography, the extraction of phase information directly impacts the accuracy and resolution of the results. In this study, an adaptive wavelet basis frequency selection method is proposed for extracting the phase information of moiré fringes. The theories of wavelet basis frequency selection are derived based on the moiré fringe intensity distribution, followed by numerical simulations that demonstrate the feasibility and reliability of our method. Subsequently, validation experiments are performed, in which the phase information obtained by the adaptive method is compared with that obtained by Fourier and ridge detection methods. The results indicate that the introduction of adaptive wavelet basis frequency selection demonstrates advantages in noise resistance, accuracy, and efficiency. Meanwhile, it exhibits greater adaptability and robustness to moiré fringes with different carrier frequencies. In summary, the introduction of adaptive wavelet basis frequency opens great possibilities for the precise analysis of complex optical fringes, which will expand the application potential of moiré tomography.
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