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Performance enhancement approach for a snapshot interferometer sensor of surface inspection
Applied Optics
|August 12, 2025
Summary
This study enhanced optical surface measurement using a snapshot interferometer with super-luminescent diodes (SLDs). The research reduced measurement noise, improving surface inspection accuracy for engineered components.
Area of Science:
- Optical Engineering
- Metrology
- Surface Science
Background:
- Online surface measurement methods are gaining interest in academia and industry.
- Accurate and rapid measurement of engineered surfaces is crucial for quality control.
Purpose of the Study:
- To evaluate the effectiveness of a snapshot dispersive optical interferometer sensor.
- To investigate the impact of super-luminescent diodes (SLDs) on fringe pattern visibility and measurement noise.
Main Methods:
- Illumination and examination of a snapshot dispersive optical interferometer sensor.
- Utilized two types of high-powered super-luminescent diodes (SLDs).
- Analyzed interference pattern visibility in first-order and zero-order scenarios.
Main Results:
- Fringe pattern visibility was assessed under different SLD illuminations.
- Identified increased noise and reduced intensity at the scanning range margin due to the dispersive line beam.
- Reduced measurement noise peak-to-peak from 28 nm to 20 nm.
Conclusions:
- The snapshot sensor shows potential for next-generation snapshot fiber link interferometry.
- Improved noise reduction enhances sensor resolution and accuracy for surface inspection applications.
