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Stitching path optimization for a rough surface interference test.

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    Phase unwrapping for rough surfaces is improved using block processing and optimized stitching. This method significantly reduces global phase errors common in least-squares approaches for interferometry.

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    Area of Science:

    • Optical Metrology
    • Interferometry
    • Image Processing

    Background:

    • Phase unwrapping is essential in phase-shifting interferometry, directly affecting measurement precision.
    • The discrete cosine transform-based least-squares (DCT-LS) method is used for unwrapping rough surface interference data.
    • DCT-LS can introduce global phase errors despite providing smooth results.

    Purpose of the Study:

    • To suppress error propagation in least-squares phase unwrapping.
    • To improve the unwrapping results for rough surfaces using a novel stitching approach.
    • To optimize the stitching path for enhanced accuracy.

    Main Methods:

    • Implemented a block phase unwrapping and stitching scheme.
    • Developed an optimized stitching path planning method.
    • Validated through simulations and experimental optical processing.

    Main Results:

    • The block phase unwrapping and stitching method significantly reduces global phase errors.
    • Optimized stitching path planning yields superior unwrapping results compared to serpentine paths.
    • The proposed method enhances the precision of phase measurement for rough surfaces.

    Conclusions:

    • Block phase unwrapping with optimized stitching effectively mitigates errors in DCT-LS.
    • The optimized path planning is crucial for achieving accurate phase unwrapping of rough surfaces.
    • This approach offers a more reliable solution for optical processing applications requiring precise phase measurements.