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Particle positioning and characterization using wavefront curvature with a convolutional neural network in digital
Applied Optics
|August 12, 2025
Summary
Accurate particle characterization using digital holography (DH) is improved with a new AI method. This approach precisely determines particle radius, position, and refractive index, even in low-NA systems.
Area of Science:
- Optical Physics
- Computational Imaging
- Particle Metrology
Background:
- Accurate simultaneous determination of spherical particle parameters (axial position, radius, refractive index) is challenging in digital holography (DH).
- Low-numerical-aperture (NA) optical setups, common in applications like fluid dynamics and aerosol characterization, provide a wide field of view but yield fewer interference fringes, complicating conventional analysis.
- This limitation hinders precise parameter estimation crucial for many scientific and industrial applications.
Purpose of the Study:
- To develop and validate a novel method for accurate and simultaneous determination of spherical particle parameters in digital holography.
- To overcome the limitations of conventional analysis, particularly in low-NA optical systems.
- To enhance the capabilities of DH for particle characterization across various NA configurations.
Main Methods:
- A one-dimensional convolutional neural network (1D-CNN) was developed and trained.
- The network was trained using wavefront curvature profiles along the optical axis.
- The method was tested on both low-NA (0.02) and high-NA systems, with experimental validation.
Main Results:
- The proposed method accurately and simultaneously determines particle radius, axial position, and refractive index.
- In a low-NA setup, the method achieved high accuracy: 0.3% for radius, 2.0% for axial position, and 7.0% for refractive index.
- Performance significantly outperformed conventional holographic interference pattern analysis methods.
Conclusions:
- The 1D-CNN approach effectively addresses the challenges in DH particle parameter estimation, especially for low-NA systems.
- This method enhances DH capabilities for particle characterization in diverse applications requiring any NA.
- The validated technique offers a robust solution for precise, simultaneous multi-parameter determination of spherical particles.
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