Dual-Functional Ag-ZnO Nanocomposite Interlayers Enable Robust Copper Metallization on NiFe2O4 Substrates for

Guo-Liang Liu1, Diwen Jiang1, Li Wang1

  • 1School of Materials and Energy, University of Electronic Science and Technology of China, Chengdu 611731, P. R. China.

Summary

This study introduces silver-doped zinc oxide interlayers for robust copper adhesion on ferrite substrates, enabling high-performance millimeter-wave devices. This breakthrough overcomes metallization challenges for 5G systems.