Non-interferometric measurement method for spherical lens surface profile via multiplane accelerated Wirtinger flow

Area of Science:

• Optical Metrology
• Precision Engineering

Background:

• Spherical lenses are crucial optical components, but surface errors degrade wavefront quality.
• Interferometry is the standard for surface characterization but requires complex setups and environmental stability.
• Existing methods face limitations due to environmental sensitivity and specialized equipment needs.

Purpose of the Study:

• To introduce a novel non-interferometric method for spherical lens surface profile measurement.
• To provide a cost-efficient and robust metrological solution for optical components.

Main Methods:

• Development and application of multiplane accelerated Wirtinger flow (MP-AWF).
• Utilizing a compact optical arrangement for simultaneous phase and amplitude measurement.
• Obtaining surface profile from phase data and defect distribution from amplitude data.

Main Results:

• The MP-AWF method successfully measures spherical lens surface profiles.
• Measurement results demonstrate consistency with traditional interferometry.
• The technique allows for simultaneous phase and amplitude retrieval.

Conclusions:

• The proposed MP-AWF method is a viable, non-interferometric alternative for spherical lens metrology.
• This technique offers a cost-effective solution with reduced environmental constraints.
• MP-AWF has significant potential for routine characterization of optical components.