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Single-pixel imaging via data-driven and deep image prior dual networks
Optics Express
|August 13, 2025
Summary
A new dual-network framework improves single-pixel imaging (SPI) by combining deep image prior networks (DIP-Net) and data-driven networks (DD-Net). This approach reconstructs high-quality images faster and more effectively, even with limited data.
Area of Science:
- Optics and Photonics
- Computational Imaging
- Machine Learning for Imaging
Background:
- Single-pixel imaging (SPI) reconstructs images using a single-pixel detector, often relying on deep neural networks.
- Deep image prior networks (DIP-Net) offer quality but require many iterations; data-driven networks (DD-Net) are fast but need similar training data.
- Sub-sampling conditions in SPI reduce effective information, challenging image reconstruction quality.
Purpose of the Study:
- To introduce a novel dual-network iterative optimization (SPI-DNIO) framework for enhanced single-pixel imaging.
- To overcome the limitations of existing DIP-Net and DD-Net approaches in SPI.
- To improve image reconstruction quality and reduce iteration count in SPI, especially at low sampling rates.
Main Methods:
- Developed a dual-network iterative optimization (SPI-DNIO) framework integrating DD-Net and DIP-Net strengths.
- Designed a residual block with gradient information to enhance deep network learning from low-sampling-rate SPI data.
- Conducted indoor active lighting and outdoor passive lighting experiments to validate the framework.
Main Results:
- The SPI-DNIO framework achieved high-quality image reconstruction with significantly fewer iterations compared to traditional methods.
- The gradient-enriched residual block improved the network's ability to learn from SPI inputs with less information.
- Experimental results demonstrated exceptional reconstruction capabilities and strong generalization performance across different lighting conditions.
Conclusions:
- The proposed SPI-DNIO framework effectively combines the advantages of DD-Net and DIP-Net for superior SPI performance.
- The enhanced residual block design addresses the challenge of limited information in low sampling rate SPI.
- The framework shows promising results for both active and passive lighting scenarios, highlighting its versatility and effectiveness.

