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    This study introduces a novel polarization grating interferometer for precise large-aperture asphere measurement. The system offers enhanced insensitivity to vibration and alignment errors, simplifying complex metrology.

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    Area of Science:

    • Optical metrology
    • Precision engineering
    • Nanotechnology

    Background:

    • Subaperture stitching interferometry is crucial for high-resolution measurement of large-aperture, high-slope aspheres, extending dynamic range.
    • Traditional methods often demand high-precision multi-axis motion control and vibration-free environments, limiting practical applications.
    • Existing techniques are susceptible to mechanical adjustments and alignment errors, impacting measurement accuracy.

    Purpose of the Study:

    • To propose a novel polarization grating-based circular subaperture stitching interferometer.
    • To develop a virtual-real combination algorithm for enhanced measurement accuracy and robustness.
    • To achieve non-null measurement that is insensitive to vibration and alignment errors.

    Main Methods:

    • Utilized a polarization grating for subaperture scanning via axial rotation, replacing complex multi-axis systems.
    • Employed polarization phase-shifting interferometry for transient, single subaperture measurements.
    • Implemented a virtual-real combination algorithm to mitigate retrace and alignment errors.

    Main Results:

    • The proposed system is more compact and reduces errors from mechanical adjustments compared to traditional methods.
    • Demonstrated improved insensitivity to vibration during individual subaperture measurements.
    • The virtual-real combination algorithm effectively suppressed retrace errors and reduced alignment error impact.

    Conclusions:

    • The polarization grating-based circular subaperture stitching interferometer offers significant insensitivity to vibration and large alignment tolerance.
    • The system and virtual-real combination algorithm provide a robust and accurate solution for aspheric surface metrology.
    • This research offers innovative insights for advanced optical measurement techniques.