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Noise analyses of Vernier-effect-based fiber sensing systems
Optics Express
|August 13, 2025
Summary
This study models amplitude noise in Vernier-effect fiber sensing, revealing a fitting method for envelope extrema identification is more robust across bandwidths than direct fringe locating, improving sensor reliability.
Area of Science:
- Optical sensing technologies
- Fiber optic interferometry
- Metrology and measurement science
Background:
- Vernier-effect-based fiber sensing systems utilize spectral interferograms for physical parameter measurement.
- Amplitude noise in these systems introduces measurement errors, with limited understanding of its impact.
- Accurate identification of spectral envelope extrema is crucial for precise sensing.
Purpose of the Study:
- To propose a model for amplitude noise distribution in Vernier-effect spectral interferograms.
- To investigate the statistical characteristics of errors in identifying spectral envelope extrema.
- To compare the performance of two distinct extremum identification methods under amplitude noise.
Main Methods:
- Development of a mathematical model for amplitude noise distribution.
- Numerical simulations to analyze error statistics in extremum identification.
- Evaluation of direct fringe extremum locating versus envelope fitting methods.
Main Results:
- The standard variance of extremum deviation using direct fringe locating is bandwidth-limited, improving with signal-to-noise ratio (SNR) and free spectral range (FSR).
- The envelope fitting method demonstrates a consistently small standard variance, independent of envelope bandwidth.
- Amplitude noise significantly affects direct extremum identification but is mitigated by the fitting approach.
Conclusions:
- The envelope fitting method offers superior robustness against amplitude noise for Vernier-effect fiber sensors.
- The proposed noise model and analysis provide a theoretical foundation for enhancing sensor accuracy.
- These findings support the broader application of Vernier-effect-based sensors in various physical parameter measurements.

