Investigation on interference effects of CCD detectors by 1064 nm pulsed/continuous lasers

When a laser irradiates a CCD detector, image quality may degrade, leading to reversible interference effects such as single-pixel saturation, crosstalk, and complete saturation. This study investigates these interference effects on CCD detectors due to laser exposure using an optical interference simulation technique based on a scattering convolution point spread model and a liquid-charge differential evolution model for simulating carrier potential well accumulation and evolution. This method enables unified and rapid simulation of laser interference effects on CCD detectors, specifically allowing for the acquisition of dazzled images and the quantification of saturated pixel counts under both pulsed and continuous laser irradiation. Comparative analysis demonstrates that the simulation aligns well with experimental results and effectively elucidates the pattern of pixel saturation, especially regarding crosstalk effect. Reliability of the interference simulation theory is validated and the accuracy of the developed model is confirmed to be excellent. This model serves as a valuable reference for further research on laser interference in optoelectronic detectors, as well as for laser protection and performance optimization in imaging systems.