Fourier ptychography microscopy with programmable beam illumination

Fourier ptychographic microscopy (FPM) is a computational imaging technique that combines multiple low-resolution images captured under varying illumination angles to achieve high-resolution, wide-field imaging. In the present work, we develop an advanced FPM system to enhance its flexibility by illuminating the sample with a sequence of programmable beams. Such programmable beams are generated by employing computer-generated holography technique, realized with a spatial light modulator to create re-configurable binary grating patterns, that enable precise and dynamic control over the illumination pattern. Furthermore, the programmability of pattern generation facilitates intensity uniformization, realization of different imaging modalities, and compensation of aberrations, of the illumination beams directly, thereby, enhancing the imaging resolution, accuracy, and robustness of the system. Proof-of-concept simulation and experimental results are provided to demonstrate the feasibility and effectiveness of the proposed programmable-based beam illumination FPM system.