Revealing a Pathway for Low-Temperature Recrystallization in Germanium
Gihan Velişa1, Eva Zarkadoula2, Decebal Iancu1
1Horia Hulubei National Institute for Physics and Nuclear Engineering, IF, Măgurele, 077125, Romania.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)
|August 14, 2025
Summary
Ionization-induced recovery offers a nonthermal pathway for complete structural restoration in damaged germanium at room temperature. This novel method reverses irradiation-induced amorphization, overcoming limitations of traditional annealing methods.
Area of Science:
- Materials Science
- Solid State Physics
- Semiconductor Physics
Background:
- Traditional thermal annealing for semiconductor repair faces limitations like dopant diffusion.
- Achieving complete structural restoration in damaged germanium typically requires elevated temperatures.
Purpose of the Study:
- To demonstrate a nonthermal pathway for complete structural restoration in predamaged germanium.
- To investigate the reversibility of irradiation-induced crystalline-to-amorphous transformation in germanium.
- To understand the mechanisms of ionization-induced recovery.
Main Methods:
- Experimental irradiation of germanium with incident ions.
- Computational modeling to analyze energy transfer and defect dynamics.
- Characterization of structural changes and defect annihilation.
Main Results:
- Complete structural restoration in predamaged germanium achieved via ionization-induced recovery at room temperature with low energy transfer (2.4 keV nm⁻¹).
- Demonstrated reversibility of the crystalline-to-amorphous transformation in germanium without additional thermal energy.
- Observed distinct recovery kinetics in partially damaged versus preamorphized germanium, influenced by initial defect structures.
Conclusions:
- Ionization-induced recovery provides an effective nonthermal method for repairing radiation damage in germanium.
- The reversibility of amorphization opens new avenues for materials processing and device fabrication.
- Understanding defect recovery kinetics is crucial for optimizing radiation damage mitigation strategies in germanium-based devices.
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