P-N junction
The Electrical Double Layer
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Updated: Jul 24, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Meng Wang1, Fengren Cao1, Linxing Meng1
1School of Physical Science and Technology, Jiangsu Key Laboratory of Frontier Material Physics and Devices, Suzhou Key Laboratory of Intelligent Photoelectric Perception, Jiangsu Key Laboratory of Advanced Negative Carbon Technologies, Center for Energy Conversion Materials & Physics (CECMP), Soochow University, Suzhou, People's Republic of China.
Researchers developed a self-assembly perovskite strategy to create optoelectronic devices on complex, non-developable surfaces. This method enables precise integration for advanced applications in bionics and optical imaging.
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