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Non-iterative distortion correction for Scheimpflug multi-view microscopic fringe projection profilometry.

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    This study presents a novel, non-iterative method to correct lens distortion in microscopic fringe projection profilometry (MFPP) systems. The technique significantly improves 3D measurement accuracy and enables seamless multi-view fusion for micro-scale industrial inspection.

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    Area of Science:

    • Metrology and Measurement Science
    • Optical Engineering
    • Microscopy and Imaging

    Background:

    • Microscopic fringe projection profilometry (MFPP) is crucial for microscale industrial part inspection.
    • Scheimpflug multi-view imaging extends depth of field (DOF) but is challenged by lens distortion.
    • Lens distortion degrades measurement accuracy and hinders seamless multi-view data fusion.

    Purpose of the Study:

    • To introduce a non-iterative distortion correction method for Scheimpflug multi-view MFPP.
    • To enhance the accuracy and efficiency of micro-scale 3D metrology.
    • To enable seamless fusion of data from multiple views in MFPP systems.

    Main Methods:

    • Developed a non-iterative approach to directly remap camera and projector pixels using pre-calibrated parameters.
    • Calculated undistorted fringe positions by intersecting sight lines with a sub-pixel-interpolated Digital Micromirror Device (DMD) grid.
    • Eliminated the need for pattern reloading or iterative optimization in the distortion correction process.

    Main Results:

    • Reduced root-mean-square error (RMSE) for 3D measurements of planes by 43.5% and spheres by 21.1% in a dual Scheimpflug camera system.
    • Demonstrated seamless multi-view fusion capabilities through reconstruction of a complex aircraft model.
    • Achieved a computationally efficient and accurate solution for micro-scale 3D metrology challenges.

    Conclusions:

    • The proposed non-iterative distortion correction method significantly enhances MFPP accuracy.
    • The technique facilitates effective multi-view data fusion for complex microscale metrology.
    • This approach offers an efficient and precise solution for industrial micro-scale 3D inspection.