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X-ray Crystallography

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

$X-ray Diffraction of Biological Samples$ 01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...

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Related Experiment Video

Updated: Sep 11, 2025

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Compact X-ray autocollimator using dynamical Laue diffraction.

Chaoqun Sun, Fugui Yang, Xiaowei Zhang

|August 15, 2025

Summary

This summary is machine-generated.

We developed a new X-ray autocollimator using thick silicon crystals for precise angle measurements. This compact device offers superior sensitivity compared to traditional methods, advancing precision metrology.

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$High Pressure Single Crystal Diffraction at PX^2$

High Pressure Single Crystal Diffraction at PX^2

Published on: January 16, 2017

Area of Science:

Physics
Materials Science
Metrology

Background:

Precision angle measurement is crucial for advanced scientific instruments.
Traditional autocollimators have limitations in sensitivity and compactness.

Purpose of the Study:

To introduce a novel X-ray autocollimator for ultra-precision angle measurement.
To demonstrate the effectiveness of Laue diffraction in thick silicon crystals for angular amplification.

Main Methods:

Utilizing Laue diffraction in thick silicon crystals (5 mm).
Leveraging angular amplification and anomalous absorption effects.
Applying the dynamical theory of X-ray diffraction.

Main Results:

Achieved a sensitivity of 142 µm/µrad for (220) planes.
Outperformed traditional autocollimators by two orders of magnitude.
Demonstrated a compact and highly sensitive measurement device.

Conclusions:

The developed X-ray autocollimator offers unprecedented sensitivity and compactness.
This technology enhances precision metrology for synchrotron radiation facilities.
It enables high-sensitivity, broad-angle measurements when combined with traditional methods.