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Updated: Apr 12, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Yuriy Chushkin1, Jonathan Correa2, Alexandr Ignatenko3
1ESRF - The European Synchrotron, 71 avenue des Martyrs, 38000 Grenoble, France.
This study demonstrates nanosecond resolution for X-ray detectors using an event-driven mode, enabling the capture of numerous images. This breakthrough overcomes pixel limitations for studying fast dynamic processes.
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Published on: February 21, 2017
11:27Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
Published on: December 8, 2016
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