Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.6K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.6K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Differential perforin sensitivity drives lineage-dependent resistance to CAR T-cell killing in blood cancer cell lines.

Blood advances·2026
Same author

Advancing mechanobiology from single molecules to complex cellular systems.

Nature nanotechnology·2026
Same author

Mechanically Programmable DNA Hydrogel Microparticles for 3D Cellular Systems.

Advanced materials (Deerfield Beach, Fla.)·2026
Same author

Piezo1 regulates the mechanotransduction of soft matrix viscoelasticity.

Nature communications·2025
Same author

Co<sup>2+</sup>-mediated adsorption facilitates atomic force microscopy of DNA molecules at double-helix resolution.

Nanoscale·2025
Same author

Polymyxin B lethality requires energy-dependent outer membrane disruption.

Nature microbiology·2025

Related Experiment Video

Updated: Sep 10, 2025

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.9K

High-Speed Quantitative Nanomechanical Mapping by Photothermal Off-Resonance Atomic Force Microscopy.

Hans Gunstheimer1,2, Gotthold Fläschner2,3, Jonathan D Adams2

  • 1Institute of Microstructure Technology, Karlsruhe Institute of Technology (KIT), P.O. Box 3640, 76021, Karlsruhe, Germany.

Small (Weinheim an Der Bergstrasse, Germany)
|August 21, 2025
PubMed
Summary
This summary is machine-generated.

This study introduces photothermal off-resonance tapping (PORT) to accelerate atomic force microscopy (AFM) force spectroscopy. This new method enables high-throughput nanomechanical mapping of diverse materials.

Keywords:
atomic force microscopyforce spectroscopynanomechanical characterizationoff‐resonance tappingphotothermal excitation

More Related Videos

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

869
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

1.7K

Related Experiment Videos

Last Updated: Sep 10, 2025

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.9K
High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

869
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

1.7K

Area of Science:

  • Materials Science
  • Nanotechnology
  • Physics

Background:

  • Atomic force microscopy (AFM) is a key technique for nanoscale surface topography and nanomechanical property measurements.
  • Current AFM force spectroscopy methods are limited by slow measurement speeds, hindering high-throughput analysis.
  • There is a need for faster methods to quantitatively map nanomechanical properties across various materials.

Purpose of the Study:

  • To develop and validate a novel method for significantly increasing the speed of AFM force spectroscopy measurements.
  • To enable high-throughput, quantitative nanomechanical mapping using AFM.
  • To explore the application of photothermal actuation for enhanced AFM probe control.

Main Methods:

  • Introduction of photothermal off-resonance tapping (PORT) for AFM probe actuation.
  • Utilizing photothermal actuation to modulate the AFM probe at high frequencies, exceeding traditional piezo-driven scanners.
  • Developing accurate models for the microscale thermal and mechanical behavior of the AFM probe to ensure precise position determination.

Main Results:

  • Achieved at least an order of magnitude increase in the speed of force spectroscopy measurements.
  • Demonstrated the capability for rapid and quantitative nanomechanical examination.
  • Successfully mapped nanomechanical properties of polymeric and metallic materials with high throughput.

Conclusions:

  • The PORT method offers a significant advancement in AFM capabilities for nanomechanical analysis.
  • High-throughput quantitative nanomechanical mapping is now feasible for a broader range of materials.
  • This technique paves the way for accelerated materials characterization at the nanoscale.