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0.91 V reference, 3.3 ppm/°C Sub-BGR with second-order compensation and improved PSRR.

Chokkakula Ganesh1, Satheesh Kumar S2, A Shanthi3

  • 1Deptartment of Electronics and Communication Engineering, VNR Vignana Jyothi Institute of Engineering and Technology, Hyderabad, India.

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|August 23, 2025
PubMed
Summary

This study presents a novel Bandgap Reference (BGR) circuit offering superior temperature stability and process variation tolerance. The optimized design achieves a significantly lower temperature coefficient and improved power supply rejection ratio for analog applications.

Keywords:
Complementary-to-absolute-temperature (CTAT)Operational amplifierPower supply rejection ratio (PSRR)Process–voltage–temperature (PVT)Proportional-to-absolute-temperature (PTAT)StartupTemperature coefficient (TC)

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Area of Science:

  • Electrical Engineering
  • Analog Integrated Circuit Design

Background:

  • Bandgap Reference (BGR) circuits are fundamental for stable voltage generation.
  • Conventional BGR designs face challenges with temperature stability and process variations.
  • High-precision applications demand improved performance metrics like temperature coefficient and PSRR.

Purpose of the Study:

  • To design and analyze a novel Bandgap Reference (BGR) circuit.
  • To enhance temperature stability and minimize process variation effects.
  • To achieve superior performance compared to existing BGR topologies.

Main Methods:

  • Implementation of a second-order compensation technique.
  • Design of an optimized error amplifier and a low-temperature-coefficient resistor network.
  • Development of a robust startup mechanism for stable circuit operation under PVT variations.
  • Simulation and comparison with conventional CM-BGR, Cascaded CM-BGR, Op-Amp based-BGR, and Sub-BGR.

Main Results:

  • Achieved a temperature coefficient of 3.33 ppm/°C (58.97-78.79% reduction).
  • Demonstrated 1.12×-6.02× improvement in Power Supply Rejection Ratio (PSRR).
  • Showcased 96% improved line regulation with 723 µV variation.
  • Validated superior performance over Op-Amp based-BGR and Sub-BGR techniques.

Conclusions:

  • The proposed BGR circuit offers significant improvements in temperature stability and process variation tolerance.
  • The enhanced performance makes the BGR highly suitable for high-precision analog and mixed-signal applications.
  • The design, simulated using 32nm CMOS technology, represents a notable advancement in BGR circuit design.