Related Experiment Video
Updated: Sep 8, 2025

Fabrication and Characterization of High-Q Silicon Nitride Membrane Resonators
Published on: August 8, 2025
Fabrication and Characterization of High-Q Silicon Nitride Membrane Resonators
Atkin D Hyatt1, Oscar A Flores2, Aman R Agrawal2
1Wyant College of Optical Sciences, University of Arizona, Tucson; atkindavidhyatt@arizona.edu.
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Silicon nitride membranes are a widely used optomechanical resonator platform, offering high mechanical Q, low optical loss, and enhanced optomechanical coupling using a panoply of strain, phononic-crystal, and photonic-crystal engineering techniques. Despite their ubiquity, fabrication and characterization of silicon nitride membranes often rely on tacit knowledge shared between research groups. This article presents a detailed video walk-through of the design, fabrication, and characterization of a contemporary silicon nitride membrane resonator (specifically, a centimeter-scale Si3N4 nanoribbon supporting torsional modes with Q-factors exceeding 108 at room temperature). The protocol covers finite element simulation, wafer- and chip-scale processing, and optical lever-based readout. Special attention is given to photolithographic patterning, dry- and wet-etching, device handling, and ringdown measurement. The tutorial is intended as both a practical entry point for newcomers and a reference for experienced groups replicating or adapting similar devices. All procedures are demonstrated in standard university cleanroom and benchtop environments.

