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Halide Perovskites for Self-Driven X-Ray Detection
Shanxiao Lin1, Yulong Wang1, Qiang Wang1
1College of Electronic and Optical Engineering and College of Flexible Electronics (Future Technology), Nanjing University of Posts and Telecommunications, Nanjing, 210023, P. R. China.
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Recently, halide perovskite X-ray detectors have demonstrated sensitivity orders of magnitude higher than that of state-of-the-art α-Se X-ray detectors, holding great potential to reshape the X-ray detector industry. However, the high dark current and severe baseline drift, caused by carrier injection and ion migration under external electric fields, hinder their practical use. In this context, perovskites are engineered as either semiconductor junctions or ferroelectrics to enable self-driven X-ray detection with ultralow dark current and negligible baseline drift, marking a cutting-edge development in the field. However, no efforts have been made to give a comprehensive review of perovskite self-driven X-ray detectors. This review aims to fill this research gap. It begins with a discussion of the basic physics underlying self-driven X-ray detection, followed by an analysis of its key performance metrics. Then, recent advances in self-driven X-ray detectors based on perovskite semiconductor junctions and ferroelectrics are critically reviewed, during which the remaining bottleneck issues are highlighted. Finally, it summarizes general guidelines drawn from previous endeavors and offers a perspective on the future development of perovskite self-driven X-ray detectors.
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