Practical Guidance on Selecting Analytical Methods for PFAS in Semiconductor Manufacturing Wastewater

Area of Science:

• Environmental Chemistry
• Analytical Chemistry

Background:

• Per- and polyfluoroalkyl substances (PFAS) are prevalent contaminants in industrial wastewater.
• Understanding PFAS structure-property relationships is crucial for effective analysis.

Purpose of the Study:

• To provide an overview of PFAS nomenclature, structure, and properties relevant to analytical method selection.
• To guide the choice of analytical methods for PFAS in treated semiconductor wastewater.

Main Methods:

• Review of fundamental concepts linking PFAS structure to physical-chemical properties.
• Comparison of standardized analytical methods (EPA, ASTM) for target and ultrashort PFAS.
• Evaluation of methods for volatile, nonvolatile, suspect, and nontarget PFAS.
• Assessment of nonspecific methods (total fluorine, precursor assays) and advanced detection techniques.

Main Results:

• PFAS properties significantly influence the suitability of analytical methods.
• Guidance tables are provided for method selection based on specific PFAS structures found in semiconductor wastewater.
• Current methods for sample handling, target PFAS, and total fluorine are compared.

Conclusions:

• Effective analysis of PFAS in semiconductor wastewater requires careful consideration of PFAS structure and properties.
• A comprehensive approach encompassing various analytical methods is necessary for accurate PFAS assessment.
• The review offers practical guidance for method selection and highlights emerging monitoring technologies.