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Updated: Jul 17, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Kiyong Kim1,2, Jahyun Kim3, Freddy Baltazar Iniguez1,2
1SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea.
Researchers developed a transparent electromagnetic interference (EMI) shielding film using Ti3C2Tx MXene particles in metallic fibers. This film offers high EMI shielding and visible light transmission, ideal for advanced optoelectronics.
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