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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Lorenzo Benatti1, Tommaso Zanotti1, Francesco Maria Puglisi1
1Dipartimento di Ingegneria "Enzo Ferrari", Università di Modena e Reggio Emilia, Via P. Vivarelli 10/1, 41125 Modena, MO, Italy.
This study introduces an optimized biasing circuit for metal oxide semiconductor field effect transistor (MOSFET) pseudo-resistors, improving integrated circuit design by reducing area, offset, and power consumption.
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