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Investigation on the Interfacial Delamination of Glass Substrate Packaging Using Cohesive Zone Models.

Tianzuo Qin1, Wen Yang1, Qiqin Wei1

  • 1School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin 541004, China.

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This study analyzes glass substrate packaging delamination using experiments and simulations. It establishes a cohesive zone model to predict interface strength and assess reliability under thermal stress.

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Area of Science:

  • Materials Science
  • Mechanical Engineering
  • Semiconductor Packaging

Background:

  • Glass substrate packaging is a growing trend in electronic devices.
  • Understanding interface delamination is crucial for packaging reliability.
  • Accurate characterization of material interfaces is needed.

Purpose of the Study:

  • To analyze the delamination behavior of the substrate-adhesive layer-chip structure in glass substrate packaging.
  • To establish a cohesive zone model for predicting crack initiation and propagation.
  • To evaluate the reliability and delamination risks of the packaging structure.

Main Methods:

  • Experimental testing to obtain interface strength parameters and load-displacement curves.
  • Iterative combination of experiments and simulations to develop a cohesive zone model.
  • Simulation analysis using calibrated cohesive parameters to assess thermal delamination risks.

Main Results:

  • Experimentally determined critical load values for interface delamination.
  • Clear observation of delamination locations within the packaging structure.
  • Acquired cohesive parameters accurately reflect interface strength for fracture evaluation.

Conclusions:

  • The developed cohesive zone model effectively characterizes interface delamination in glass substrate packaging.
  • The study provides a reliable method for assessing packaging reliability under thermal conditions.
  • This research supports the advancement of robust glass substrate packaging technologies.