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Updated: Sep 9, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Large-Area Monolayer p-Type Semiconductor Films Toward High-Performance Electrical Device Arrays
Lingxiao Yu1, Junyang Tan2, Hanyuan Ma1
1State Key Laboratory of New Ceramic Materials, School of Materials Science and Engineering, Tsinghua University, Beijing, 100084, China.
Abstract:
2D semiconductors open new avenues in the post-Moore era for semiconductor technologies immune from the short-channel effect due to their atomic-scale thicknesses and dangling-bond-free surfaces. However, it still remains a big challenge to obtain large-area and high-quality monolayer p-type semiconductors so far. Herein, a controlled nucleation is realized by tuning the evaporation areas of Se precursors during the p-type WSe2 growth. By optimizing the nucleation density, centimeter-scale uniform monolayer WSe2 and Nb-incorporated WSe2 films are synthesized. The field effect transistor array based on WSe2 film exhibits p-type behavior with hole mobilities of 34 ± 17 cm2 V-1 s-1 and an average on/off ratio of 4 × 107, which can be further improved by Nb incorporation with much higher hole mobility of 48 ± 16 cm2 V-1 s-1 with an average on/off ratio of ≈108. The work paves the way for synthesizing large-scale uniform 2D p-type semiconductors for electrical devices and integrated circuits.

