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X-ray near-field multi-slice ptychography for in-situ imaging
Sina Röper1,2, Karolina Stachnik3, Jonas Voss1
1Center for Hybrid Nanostructures, Institute for Nanostructure and Solid-State Physics, University of Hamburg, Luruper Chaussee 149, 22761, Hamburg, Germany.
Abstract:
In-situ imaging of chemical reactions can provide valuable insight into nanoparticle growth and structural evolution. Hard X-ray imaging is an excellent tool for this purpose, as it combines high spatial resolution with high penetration depth, allowing for realistic reaction environments. While far-field ptychography is a well-established method at synchrotron radiation sources, its near-field analog has received less attention. In this work we show that near-field multi-slice ptychography is a competitive method for high-resolution in-situ imaging by studying the formation of gold nanocages via galvanic replacement. Our work extends near-field X-ray ptychography to sub-50 nm spatial resolution by using multilayer Laue lenses. These high numerical aperture optics enable to distinguish sample layers that are separated by less than 100 µm by multi-slicing techniques.
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