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Updated: Sep 9, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
Cryogen-free variable-temperature Kelvin probe force microscopy for probing local chemical potential in van der Waals
Namkyung Lee1, Seungwon Jung1, Baeksan Jang1
1Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul 08826, Republic of Korea.
Abstract:
We report the development of a variable-temperature Kelvin probe force microscopy (KPFM) system based on a Gifford-McMahon cryocooler, which enables stable and highly sensitive operation across a broad temperature range. The system integrates a custom-designed phase-locked loop, automatic gain control, and compact passive vibration isolation stages, effectively suppressing mechanical vibrations intrinsic to cryostats. We demonstrate the system's performance using a monolayer graphene (MLG) device encapsulated in hexagonal boron nitride, serving as a benchmark platform to validate spatial resolution and CPD sensitivity. Despite the presence of a dielectric encapsulation layer, our system achieves high CPD sensitivity. Temperature-dependent measurements further confirm the capability to resolve subtle changes in chemical potential near the charge neutrality point, consistent with the known electronic structure of MLG. This work establishes a variable temperature KPFM platform suitable for investigating temperature-dependent quantum electronic phases in van der Waals heterostructures.
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