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Development of high-sensitivity data collection system for time-resolved x-ray diffraction measurement at the photon
Le Thi My Nguyen1, Shunsuke Nozawa1,2, Daisuke Okuyama1,2
1Department of Materials Structure Science, The Graduate University for Advanced Studies (SOKENDAI), 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.
The Review of Scientific Instruments
|September 3, 2025
Summary
A new high-sensitivity system enhances time-resolved X-ray diffraction experiments. This advancement allows for detailed studies of weak signals, enabling ultrafast control of material properties.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Photon Science
Background:
- Time-resolved X-ray diffraction (TRXRD) is crucial for understanding dynamic material processes.
- Conventional TRXRD systems often struggle with low signal-to-noise ratios, limiting the study of weak structural changes.
- Advancements in detector technology and experimental design are needed to overcome these limitations.
Purpose of the Study:
- To develop and present a high-sensitivity data collection and measurement system for TRXRD experiments.
- To improve measurement sensitivity for detecting weak diffraction signals.
- To enable ultrafast time-resolved studies of materials with challenging signal characteristics.
Main Methods:
- Utilized x-ray pixel array photon counting detectors for enhanced sensitivity.
- Integrated a variable repetition rate laser for synchronization with synchrotron X-ray sources and detectors.
- Implemented single and double electronic gating schemes for precise data acquisition.
- Configured the system at the Photon Factory Advanced Ring.
Main Results:
- Demonstrated a significant improvement in measurement sensitivity compared to existing systems.
- Successfully measured transient dynamics of a weak X-ray diffraction peak in vanadium dioxide.
- Observed laser-induced modulation of long-range dimerized structural ordering.
Conclusions:
- The developed system facilitates ultrafast time-resolved X-ray measurements, even for weak signals.
- This capability opens new avenues for studying challenging materials and phenomena.
- The system provides a potential route toward ultrafast control of material physical properties.
