High-resolution computed tomography of two-dimensional beam profile using dual-axis rotating wire

Area of Science:

• Physics
• Engineering
• Particle Beam Technology

Background:

• Wire probes offer robust beam profile measurement but are limited to 1D projections.
• Accurate 2D beam profile data is crucial for various particle beam applications.

Purpose of the Study:

• To develop and validate a novel method for complete 2D beam profile measurement.
• To enable 360° angular projection and image reconstruction for comprehensive beam analysis.

Main Methods:

• Utilized a dual-axis wire rotation system for 360° beam projection.
• Employed image reconstruction, optimizing with the order subsets expectation maximization (OSEM) algorithm.
• Conducted proof-of-principle experiments with an Ar+ ion beam.

Main Results:

• Achieved highly accurate absolute 2D beam profiles.
• Demonstrated millisecond-scale processing time for reconstruction.
• Enabled determination of beam direction and phase-space distribution from 2D profiles.

Conclusions:

• The developed dual-axis wire rotation and OSEM reconstruction method provides a versatile and accurate 2D beam profiling solution.
• This technique significantly enhances particle beam analysis capabilities.
• Potential applications span particle therapy, semiconductor processing, material analysis, and fundamental research.