Electron Microscope Tomography and Single-particle Reconstruction
Computed Tomography
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Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography
Published on: February 12, 2017
Erik Fredenberg1,2,3, Daniel Collin2, Louis Carbonne2
1Department of Physics, Royal Institute of Technology (KTH), Stockholm, Sweden.
This study validates a digital twin framework for deep-silicon photon-counting CT, demonstrating its accuracy in simulating pulse pileup effects and confirming the effectiveness of a pileup correction algorithm for improved image quality.
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