Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

24.1K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
24.1K
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

2.5K
Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
2.5K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Monolithic three-dimensional integration of silicon transistors.

Nature·2026
Same author

End-to-End Autonomous Quantification of Brain Aneurysm and Parent Artery Morphology at CT Angiography.

Radiology. Artificial intelligence·2026
Same author

Uniaxial spin texture in a superconducting electron gas revealed by exchange interactions.

Science advances·2026
Same author

Each Grain Different in Its Own Way: Size-Dependent Pseudosymmetry in Fivefold Twinned Nanoparticles Mapped by 4D-STEM.

Advanced materials (Deerfield Beach, Fla.)·2026
Same author

Visualizing lattice-mismatch-dependent strain relaxation in epitaxially grown MoS<sub>2</sub>/WS<sub>2</sub>and MoS<sub>2</sub>/WSe<sub>2</sub>hetero-bilayers.

Reports on progress in physics. Physical Society (Great Britain)·2026
Same author

<i>PyExtal</i>: a Python package for quantitative convergent-beam electron diffraction.

Journal of applied crystallography·2026

Related Experiment Video

Updated: Sep 8, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.0K

Differentiating electron diffuse scattering via 4D-STEM spatial fluctuation and correlation analysis in complex FCC

Po-Cheng Kung1, Rui Feng2, Peter Liaw3

  • 1Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, 1304W. Green Street, Urbana 61801, IL, USA.

Ultramicroscopy
|September 6, 2025
PubMed
Summary

This study introduces a new method, FluCor analysis, to interpret diffuse scattering in complex alloys. It distinguishes chemical short-range ordering (CSRO) signals from other sources, clarifying scattering origins in advanced materials.

Keywords:
4D-STEMChemical Short-range OrderingDiffuse ScatteringMedium Entropy Alloy

More Related Videos

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

7.8K
Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses
08:55

Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses

Published on: June 7, 2018

8.6K

Related Experiment Videos

Last Updated: Sep 8, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.0K
Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

7.8K
Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses
08:55

Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses

Published on: June 7, 2018

8.6K

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Crystallography

Background:

  • Complex face-centered-cubic (FCC) alloys often exhibit chemical short-range ordering (CSRO).
  • Interpreting diffuse scattering in these alloys is challenging due to defects and thermal diffuse scattering.
  • Distinguishing CSRO signals from other scattering phenomena remains a significant debate.

Purpose of the Study:

  • To develop and demonstrate a novel method for analyzing local diffuse scattering.
  • To differentiate between various sources of diffuse scattering in complex alloys.
  • To resolve ambiguities in interpreting scattering signals, particularly at 1/3{422} and 1/2{311} positions.

Main Methods:

  • Spatial fluctuation and correlation (FluCor) analysis of local diffuse scattering.
  • Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM) for data acquisition.
  • Application to a (CrCoNi)93Al4Ti2Nb medium-entropy alloy (MEA).

Main Results:

  • FluCor analysis successfully differentiates diffuse scattering origins in the studied MEA.
  • Two overlapping diffuse scattering signals were identified at 1/3{422} and 1/2{311} positions.
  • These signals were attributed to non-CSRO origins: nanoscale planar defects and thermal diffuse scattering.

Conclusions:

  • The FluCor analysis method is effective for resolving complex diffuse scattering patterns.
  • The study clarifies the origins of specific scattering signals in FCC alloys, attributing them to defects and thermal effects, not CSRO.
  • The FluCor approach is broadly applicable to various order-disordered crystals, offering insights into material microstructures and CSRO behavior.