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Updated: Jan 18, 2026

High-Accuracy Correction of 3D Chromatic Shifts in the Age of Super-Resolution Biological Imaging Using Chromagnon
Published on: June 16, 2020
Zhisong Li1, Zhenwei Zhang1, Keke Liu2
1The Unit of College of Machine, Shanghai Dianji University, Shanghai, China.
This study presents an enhanced dual-probe chromatic confocal system for precise wafer thickness measurement. A novel tilt correction algorithm significantly improves accuracy by compensating for measurement errors in semiconductor manufacturing.
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