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MCH-YOLOv12: Research on Surface Defect Detection Algorithm for Aluminum Profiles Based on Improved YOLOv12
Yuyu Sun1, Heqi Yan1, Zongkai Shang1
1College of Computer Science and Technology, Changchun University, Changchun 130022, China.
Sensors (Basel, Switzerland)
|September 13, 2025
Summary
This study introduces MCH-YOLOv12, an advanced algorithm for aluminum profile surface defect detection. It improves accuracy for small and irregularly shaped defects, enhancing industrial inspection quality.
Area of Science:
- Materials Science
- Computer Vision
- Artificial Intelligence
Background:
- Surface defect detection in aluminum profiles is crucial for quality control in industrial production.
- Existing methods face challenges with imbalanced defect categories, small-scale defects, and irregular shapes, limiting accuracy and robustness.
Purpose of the Study:
- To develop an improved defect detection algorithm (MCH-YOLOv12) for aluminum profiles.
- To enhance feature extraction and capture fine-grained defect characteristics.
- To improve adaptability to various defect sizes and shapes for real-time inspection.
Main Methods:
- Modified YOLOv12 architecture incorporating MultiScaleGhost convolution in the Backbone for enhanced feature representation.
- Introduced Spatial-Channel Collaborative Gated Linear Unit (SCCGLU) in the Neck to capture directional and edge-specific defect features.
- Implemented a Hybrid Head combining anchor-based and anchor-free detection mechanisms.
Main Results:
- MCH-YOLOv12 demonstrated improved accuracy and reduced category imbalance on an aluminum profile defect dataset.
- The enhanced algorithm showed better detection of small-scale and irregularly shaped defects.
- Achieved lower computational complexity (parameters and FLOPs) compared to baseline models.
Conclusions:
- MCH-YOLOv12 offers a robust and accurate solution for surface defect detection in aluminum profiles.
- The algorithm's improvements make it suitable for real-time industrial inspection applications.
- The study highlights the effectiveness of MultiScaleGhost and SCCGLU modules in defect detection.
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