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Updated: Jan 17, 2026

A Robust Single-Particle Cryo-Electron Microscopy cryo-EM Processing Workflow with cryoSPARC, RELION, and Scipion
Published on: January 31, 2022
The separation of the effects of atomic displacement and local resolution in crystallographic and cryo-electron
Vladimir Y Lunin1, Natalia L Lunina1
1Institute of Mathematical Problems of Biology of RAS, Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Pushchino, Moscow Region 142290, Russian Federation.
Abstract:
Uncertainties in atomic coordinates and finite resolution blur the image of an atom's density present in the observed map. A resolution cutoff leads to an additional effect, known as Fourier ripples. Ignoring these ripples when calculating an atomic model map makes it difficult to deconvolute these two sources of image blurring. However, it is possible to separate the effects of the atomic displacement and local resolution cutoff in the course of real-space refinement if an advanced method for calculating the image of the atom in the observed map is used, which includes modeling of ripples.
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