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Published on: April 17, 2018
Standardizing XPS and HAXPES Analyses of LLZO Solid-State Electrolytes and Their Reactive Compounds
Huanyu Zhang1,2, Lars P H Jeurgens3, Claudia Cancellieri3
1Laboratory of Inorganic Chemistry, Department of Chemistry and Applied Biosciences, ETH Zürich, CH-8093 Zürich, Switzerland.
Surface contamination of Lithium lanthanum zirconium oxide (LLZO) hinders its use in solid-state batteries. This study provides crucial reference data using XPS/HAXPES to identify surface impurities and improve battery performance.
Area of Science:
- Materials Science
- Electrochemistry
- Surface Science
Background:
- Surface contamination of Lithium lanthanum zirconium oxide (LLZO) is a major obstacle for its application in high-performance solid-state batteries.
- Developing reliable methods to characterize and mitigate these surface issues is critical for advancing battery technology.
Purpose of the Study:
- To establish comprehensive baseline reference data for Li7La3Zr2O12 (LLZO) surfaces using X-ray photoelectron spectroscopy (XPS) and hard X-ray photoelectron spectroscopy (HAXPES).
- To develop robust procedures for calibrating and charge-correcting XPS/HAXPES energy scales for accurate cross-laboratory comparisons.
- To unambiguously identify surface contaminants and reaction layers on LLZO under various synthesis and treatment conditions.
Main Methods:
- Detailed dual-beam lab-based XPS and HAXPES analyses were performed on LLZO surfaces.
- Reference samples including Li, Li2O, LiOH, Li2CO3, La2O3, ZrO2, and La2Zr2O7 were analyzed to establish binding energy positions and chemical shifts.
- Procedures for energy scale calibration and charge correction were developed and proposed.
Main Results:
- Baseline reference data, including precise binding energy positions and chemical shifts for LLZO surface species, were established.
- The study demonstrated the capability of lab-based HAXPES to nondestructively probe compositional inhomogeneities in LLZO surfaces up to 20-30 nm depth.
- Reliable methods for identifying surface contaminants and reaction layers were proposed, crucial for understanding LLZO surface chemistry.
Conclusions:
- The established reference data and methodologies significantly enhance the ability to characterize LLZO surface contamination and reaction layers.
- Lab-based HAXPES is a powerful complementary technique to XPS for detailed, in-depth surface analysis of LLZO.
- This work provides essential foundational data and protocols for improving the performance and reliability of LLZO-based solid-state batteries.
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