Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

11.0K
Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
11.0K
Two-Dimensional Microscopy in Microbiology01:29

Two-Dimensional Microscopy in Microbiology

1.1K
Two-dimensional (2D) microscopy encompasses a range of optical techniques that capture images within a single focal plane, offering detailed representations of microscopic structures. These techniques are essential in biological and medical research, enabling the visualization of cellular and subcellular structures with different levels of contrast and specificity.There are several major types of 2D microscopy, each with strengths and applications.Bright-Field MicroscopyBright-field microscopy...
1.1K
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

20.0K
Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
20.0K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Rapid Water-Soluble Sacrificial Scaffolds for Unconstrained 3D Microfabrication via Two-Photon Lithography.

Advanced materials (Deerfield Beach, Fla.)·2026
Same author

Polarization resolved deep ultraviolet microscopy for label free imaging with enhanced nuclei and fiber contrast.

Optics and lasers in engineering·2026
Same author

Accelerated oxidation of micropollutants in the frozen Fenton-like processes at ultra-low-dose catalyst.

Water research·2026
Same author

Umbilical cord blood-derived natural killer cells: <i>in vitro, in vivo</i>, and clinical antitumor activity in non-small cell lung cancer (case series).

Annals of medicine and surgery (2012)·2026
Same author

A biodegradable nanocellulose based piezoelectric energy conversion device strengthened by designing PVA-cellulose dual-network structure for green in-situ synthesis of ZnO.

International journal of biological macromolecules·2026
Same author

Charge-Directed Photothermal Methane Dry Reforming Enabled by Interfacial TiO<sub>x</sub> Nanodomains.

Angewandte Chemie (International ed. in English)·2026

Related Experiment Video

Updated: Jan 17, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

2.3K

Compact DUV reflective Fourier ptychographic microscopy for high-throughput surface measurements.

Ruilin You, Jiabin Chen, Zhihan Hong

    Optics Letters
    |September 16, 2025
    PubMed
    Summary

    A new deep ultraviolet (DUV) reflective Fourier ptychographic microscopy (RFPM) method simplifies surface inspection. This technique uses a single LED matrix for high-resolution imaging of reflective surfaces, improving upon existing bulky setups.

    More Related Videos

    A Multimodal Wide-Field Fourier-Transform Raman Microscope
    06:48

    A Multimodal Wide-Field Fourier-Transform Raman Microscope

    Published on: December 30, 2025

    135
    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
    10:28

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

    Published on: July 5, 2016

    10.7K

    Related Experiment Videos

    Last Updated: Jan 17, 2026

    Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
    05:04

    Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

    Published on: June 13, 2023

    2.3K
    A Multimodal Wide-Field Fourier-Transform Raman Microscope
    06:48

    A Multimodal Wide-Field Fourier-Transform Raman Microscope

    Published on: December 30, 2025

    135
    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
    10:28

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

    Published on: July 5, 2016

    10.7K

    Area of Science:

    • Optics and Photonics
    • Surface Metrology
    • Microscopy

    Background:

    • High-throughput surface measurements are vital for applications like optical components and VLSI circuits.
    • Reflective Fourier ptychographic microscopy (RFPM) offers high-resolution imaging for reflective surfaces.
    • Existing RFPM methods often involve bulky illumination systems and complex calibration.

    Purpose of the Study:

    • To develop a novel, simpler, and more compact deep ultraviolet (DUV) RFPM system.
    • To overcome the limitations of previous RFPM illumination and calibration requirements.
    • To demonstrate the capability of DUV RFPM for nanometer-scale height profiling.

    Main Methods:

    • Implementation of a DUV RFPM system utilizing a single LED matrix as the illumination source.
    • Employing a 5×, 0.12 numerical aperture (NA) DUV objective lens.
    • Demonstration of the experimental setup with wafer standards and a machined concave mirror.

    Main Results:

    • Achieved a 1.6 mm field of view and 690 nm spatial resolution.
    • Enabled nanometer-scale height profiling of reflective surfaces.
    • Demonstrated a significantly simpler and more compact RFPM setup compared to prior art.

    Conclusions:

    • The novel DUV RFPM method provides a more accessible and efficient approach to high-resolution surface inspection.
    • The single LED matrix illumination simplifies the system's design and calibration.
    • This technique holds promise for various applications requiring precise reflective surface metrology.