MOSFET: Enhancement Mode
Field Effect Transistor
Semiconductors
Biasing of FET
MOSFET
Metal-Semiconductor Junctions
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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
Sheila Sim1,2, Sichao Li3, Weifan Cai2
1School of Electronic Science & Engineering, Southeast University, Nanjing, 211189, China.
This review explores methods to boost carrier mobility in 2D semiconductors, crucial for next-generation electronics. Enhancing mobility in 2D field-effect transistors (FETs) overcomes silicon
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