A Degradation Warning Method for Ultra-High Voltage Energy Devices Based on Time-Frequency Feature Prediction

Pinzhang Zhao1, Lihui Wang2, Jian Wei1

  • 1Jiangsu Institute of Metrology, Nanjing 210023, China.

Sensors (Basel, Switzerland)
|September 19, 2025
PubMed
Summary

This study introduces an improved algorithm for analyzing leakage currents in ultra-high voltage devices. It enhances fault prediction and provides early warnings for resistance plate deterioration.